CNO - CAR.M.CO .27451.057.00 de 2024

Certificado de la funcionalidad LVRT y HVTR

PARQUE FOTOVOLTAICO CARACOLI

Engineering & Construction

K. Fan G. Rivera M. Yu

COLLABORATORS VERIFIED BY VALIDATED BY GROUP TYPE COUNTRY PROJECT CODE PROGRESSIVE REVISION CAR M C O 2 7 4 5 1 0 5 7 0 0

CLASSIFICATION: FOR VALIDATION UTILIZATION SCOPE: FOR CONSTRUCTION REV DESCRIPCIÓN ELABORADOR REVISOR APROBADOR FECHA 00 S ent for Revision K. Fan G. Rivera M. Yu 21/09/2022

CANADIAN SOLAR VALIDATION

• J. Ventura R. Duran

COLABORADOR VERIFICADOR VALIDADORTRF No. IEC TS 62910_V1.0

Page 1 of 81

Test Report issued under the responsibility of:

TEST REPORT

IEC TS 62910

Utility-interconnected photovoltaic inverters - Test procedure for low voltage ride-through measurements Report Report Number. ................................ : 6092407.51 Date of issue .................................... : 2020-12-23 Total number of pages ...................... 81

Testing Laboratory ......................... : DEKRA Testing and Certification (Suzhou) Co., Ltd. Address ............................................ : No.99, Hongye Road, Suzhou Industrial Park, Suzhou, Jiangsu, P.R. China Applicant’s name ............................ : Sungrow Power Supply Co., Ltd. Address ............................................ : No.1699 Xiyou Rd., New & High Technology Industrial Development Zone, 230088, Hefei, P. R. China Test specification: Standard ........................................... : IEC TS 62910:2020 Test procedure ................................. : Type test Non-standard test method ................ : N/A Test Report Form No. ..................... : IEC TS 62910_V2.0

Test specification: Standard ........................................... : IEC TS 62910:2020

Test procedure ................................. : Type test Non-standard test method ................ : N/A Test Report Form No. ..................... : IEC TS 62910_V2.0 Test Report Form(s) Originator ........ : DEKRA Testing and Certification (Suzhou) Co., Ltd. Master TRF ...................................... : Dated 2020-08 Test item description ..................... : Grid-connected PV inverter Trade Mark ....................................... :

Manufacturer .................................... : Sungrow Power Supply Co., Ltd. No.1699 Xiyou Rd., New & High Technology Industrial Development Zone, 230088, Hefei, P. R. China Model/Type reference ...................... : SG3125HV-30, SG3125HV-31, SG3125HV-32Page 2 of 81 Report No.: 6092407.51

TRF No. IEC TS 62910_V2.0

Ratings.............................................. : Operating temperature range: - 35°C to + 60°C Protective class: I Ingress protection rating: IP65 (Optional IP55) Power factor range (adjustable): 0.8 leading…0.8 lagging

SG3125HV-30: PV input: Max. 1500 Vdc, MPPT voltage range: 875-1300 Vdc, max current: 3997 A, Isc PV: 10000 A Output: 600V, 3~, 50/60 Hz, max 3308 A, rated 3125 kW, max 3437 kVA

SG3125HV-31: PV input: Max. 1500 Vdc, MPPT voltage range: 915-1300 Vdc, max current: 3997 A, Isc PV: 10000 A Output: 630V, 3~, 50/60 Hz, max 3308 A, rated 3125 kW, max 3610 kVA

SG3125HV-32:

max current: 3997 A, Isc PV: 10000 A Output: 630V, 3~, 50/60 Hz, max 3308 A, rated 3125 kW, max 3610 kVA

SG3125HV-32: PV input: Max. 1500 Vdc, MPPT voltage range: 960-1300 Vdc, max current: 3997 A, Isc PV: 10000 A Output: 660V, 3~, 50/60 Hz, max 3308 A, rated 3125 kW, max 3781 kVAPage 3 of 81 Report No.: 6092407.51

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Responsible Testing Laboratory (as applicable), testing procedure and testing location(s):

Testing Laboratory: DEKRA Testing and Certification (Suzhou) Co., Ltd.

Testing location/ address ................................ : No.99, Hongye Road, Suzhou Industrial Park, Suzhou, Jiangsu, P.R. China Associated Testing Laboratory: Shanghai Testing & Ispection Institute for Electrical Equipment Co.,Ltd Testing location/ address ................................ : No.505, Wuning Road, Putuo District,Shanghai, China Tested by (name, function, signature) ............ : Albert Liang

Approved by (name, function, signature) ....... : Jason Guo

Testing procedure: CTF Stage 1: Testing location/ address ................................ :

Tested by (name, function, signature) ............ : Approved by (name, function, signature) ....... :

Testing procedure: CTF Stage 2: Testing location/ address ................................ :

Tested by (name + signature) ........................ : Witnessed by (name, function, signature) ...... : Approved by (name, function, signature) ....... :

Testing procedure: CTF Stage 3: Testing procedure: CTF Stage 4: Testing location/ address ................................ :

Tested by (name + signature) ........................ : Witnessed by (name, function, signature) ...... : Approved by (name, function, signature) ....... :

Testing procedure: CTF Stage 3: Testing procedure: CTF Stage 4: Testing location/ address ................................ :

Tested by (name, function, signature) ............ : Witnessed by (name, function, signature) ...... : Approved by (name, function, signature) ....... : Supervised by (name, function, signature) ..... :Page 4 of 81 Report No.: 6092407.51

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Rating label: Page 5 of 81 Report No.: 6092407.51

TRF No. IEC TS 62910_V2.0

Warning Label: Page 6 of 81 Report No.: 6092407.51

TRF No. IEC TS 62910_V2.0

Test item particulars: Equipment mobility ........................................................ :

movable hand-held stationary fixed transportable for building-in Connection to the mains ............................................... : pluggable equipment direct plug-in permanent connection for building-in Enviromental category .................................................. : outdoor indoor indoor unconditional conditional Over voltage category Mains ........................................ : OVC I OVC II OVC III OVC IV Over voltage category PV ............................................. : OVC I OVC II OVC III OVC IV Mains supply tolerance (%) ........................................... : ±10% Tested for power systems ............................................. : TN IT testing, phase-phase voltage (V) .............................. : N/A Class of equipment ........................................................ : Class I Class II Class III Not classified Mass of equipment (kg) ................................................. : 3200 Pollution degree............................................................. : Outside PD3; Inside PD2 IP protection class ......................................................... : IP65 (Optional IP55)

Possible test case verdicts:

Class of equipment ........................................................ : Class I Class II Class III Not classified Mass of equipment (kg) ................................................. : 3200 Pollution degree............................................................. : Outside PD3; Inside PD2 IP protection class ......................................................... : IP65 (Optional IP55) Possible test case verdicts: - test case does not apply to the test object ................. : N/A - test object does meet the requirement ....................... : P (Pass) - test object does not meet the requirement ................. : F (Fail) - this clause is information reference for installation .... : Info.

Testing: Date of receipt of test item ............................................ : 2020-10-25 (samples provided by applicant) Date (s) of performance of tests ................................... : 2020-10-25 to 2020-11-30

General remarks: The test results presented in this report relate only to the object tested.

This report shall not be reproduced, except in full, without the written approval of the Issuing testing laboratory. The measurement result is considered in conformance with the requirement if it is within the prescribed limit, It is not necessary to account the uncertainty associated with the measurement result. This report is only for reference and is not used for legal proof function in China market. The information provided by the customer in this report may affect the validity of the results, the test lab is not responsible for it. "(See Enclosure #)" refers to additional information appended to the report. "(see appended table)" refers to a table appended to the report.

Throughout this report a comma / point is used as the decimal separator.Page 7 of 81 Report No.: 6092407.51

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Name and address of factory (ies)

1. Sungrow Power Supply Co., Ltd.

No.1699 Xiyou Rd., New & High Technology Industrial Development Zone, Hefei 230088 P.R. China

2. Sungrow Power Supply Co., Ltd.

Name and address of factory (ies)

1. Sungrow Power Supply Co., Ltd.

No.1699 Xiyou Rd., New & High Technology Industrial Development Zone, Hefei 230088 P.R. China

2. Sungrow Power Supply Co., Ltd.

No. 608 Changning Avenue, New & High Technology Industrial Development Zone, Hefei 230088 P.R. China

3. Sungrow Developers (India) Private Limited No. 85, Kaniminike village, Kengeri hobli Bangalore South Taluk, 560074 Bangalore, IndiaPage 8 of 81 Report No.: 6092407.51

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General product information: Brief description: The PCE under test (EUT) is Grid-Connected PV Inverter which utilizes the advanced power electronics

conversion components such as MosFET, IGBT, IPM to convert the variable DC power generated from the photovoltaic (PV) arrays to the stable utility AC power which can be fed into the commercial electrical grid. The PCE under test is three-phase Grid-Connected PV Inverter for solar power generation with the rated output power of 3125 kW. The external circuit breakers or fuses for PV array and Grid connection are required which the statements are provided in the installation manual.

Block Diagram:

The models SG3125HV-31, SG3125HV-30 are identical to SG3125HV-32 except for the model name and electrical ratings. Unless otherwise specified, all the tests were conducted on the basic model of SG3125HV-32 to represent the others.

The product was tested on: Firmware version:

DSP_SG3125HV-30_V1_A LCD_SG3125HV-30_V1_A Unless otherwise specified, all tests were conducted on basic model of SG3125HV-32 to represent the other models.Page 9 of 81 Report No.: 6092407.51

IEC TS 62910

Clause Requirement - Test Result - Remark Verdict

Unless otherwise specified, all tests were conducted on basic model of SG3125HV-32 to represent the other models.Page 9 of 81 Report No.: 6092407.51

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Clause Requirement - Test Result - Remark Verdict

TRF No. IEC TS 62910_V2.0 4 Test circuit and equipment P 4.1 General P The circuits and equipment described in this clause are developed to allow tests that simulate the full range of anticipated grid faults, including: P • Single phase to ground fault (any phase) P • Two phase isolated fault, between any two phases P • Two phase grounded fault, involving any two phases P • Three phase short-circuit fault. P A full discussion of these faults and the resulting impact on voltage magnitude and phase angles is included in Annex A. P The short circuit emulator and grid simulator described in 4.3.3 and 4.3.4 are informative examples and are not intended to restrict design flexibility. Other designs may be used to achieve equivalent test functionality. The grid simulator used to achieve test of 4.3.4. P 4.2 Test circuit P The LVRT test circuit includes a DC source, the EUT, a grid fault simulator and the grid. A PV simulator (or PV array) provides input energy for the EUT. The output of the EUT is connected to the grid via a grid fault simulator, as shown in Figure 1.

PV array simulator and the grid simulator used in the LVRT test circuit. P 4.3 Test equipment P 4.3.1 Measuring instruments P Waveforms shall be measured by a device with memory function, for example, a storage or digital oscilloscope, or a high speed data acquisition device. Accuracy of the oscilloscope or data acquisition system should be at least 0.2% of full scale. The analogue to A/D of the

Waveforms shall be measured by a device with memory function, for example, a storage or digital oscilloscope, or a high speed data acquisition device. Accuracy of the oscilloscope or data acquisition system should be at least 0.2% of full scale. The analogue to A/D of the measurement device shall have at least 12 bit resolution (in order to maintain the required measurement accuracy). PPage 10 of 81 Report No.: 6092407.51

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TRF No. IEC TS 62910_V2.0

Voltage transducers (or voltage transformers) and current transducers (or current transformers) are the required sensors for measurement. The accuracy of the transducers should be 0.5 % of full scale or better. It is necessary to select the transducer measuring range depending on the normal value of the signal to be measured. The selected measuring range shall not exceed 150 % of the normal value of the measured signal. The transducer accuracy requirements are shown in Table 1

P 4.3.2 DC source P A PV array, PV array simulator or controlled DC source with PV characteristics may be used as the DC power source to supply input energy for the LVRT test. As the EUT input source, the DC power source shall be capable of supplying the EUT maximum input power and other power levels during the test, at minimum and maximum input operating voltages of the EUT. PV array simulator used as the DC power source to supply input energy. P The PV simulator should emulate the current/voltage characteristic of the PV module or PV array for which the EUT is designed. The response time of a PV simulator should not be longer than the MPP tracking response time of EUT. P For a EUT under test without galvanic isolation between the DC side and AC side, the output of the PV simulator shall not be earthed. P

should not be longer than the MPP tracking response time of EUT. P For a EUT under test without galvanic isolation between the DC side and AC side, the output of the PV simulator shall not be earthed. P The equivalent capacitance between the output of the PV simulator and earth should be as low as possible in order to minimize the impact on the EUT. P A PV array used as the EUT input source shall be capable of matching the EUT input power levels specified by the test conditions. It is necessary to select a period of time in which the solar irradiance is stable and does not vary by more than 5 % during the test. P 4.3.3 Short-circuit emulator The grid simulator used to achieve LVRT function. N/APage 11 of 81 Report No.: 6092407.51

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As part of the grid simulator device, the short-circuit emulator is used to create the voltage drops due to shortcircuits between the two or three phases, or between one or two phases to ground, via the impedance network Z1 and Z2 as shown in the test device layout in Figure 2.

N/A The impedance Z 1 is used to limit the effect of the short circuit on the utility service that powers the test circuit. The sizing of Z1 shall therefore account for all test sequences to be performed and limit the short-circuit current taken from the grid to values that do not cause an excessive reduction of the grid voltage. Considering an acceptable voltage reduction of at most 5 % when performing the test, the minimum value of Z1 shall be at least 20×ZGrid, where ZGrid is the grid short-circuit impedance measured at the test circuit connection point. N/A To ensure that the test is realistic, however, the apparent

reduction of at most 5 % when performing the test, the minimum value of Z1 shall be at least 20×ZGrid, where ZGrid is the grid short-circuit impedance measured at the test circuit connection point. N/A To ensure that the test is realistic, however, the apparent short-circuit power (SEUT) available at the EUT connection node NEUT should be at least equal to 3×Pn. where Pn is the rated power of the EUT (minimum value SEUT> 3×Pn. recommended SEUT = 5 to 6×Pn), This means that during the short-circuit tests, the contribution of current through Z1 and Z2 from the grid remains dominant compared to the current contributed by the EUT. In this way, the inverter current does not create a significant voltage rise for the duration of the test relative to the no-Ioad drop. N/A The two conditions described above define the minimum and maximum limits of Z1. The two conditions combined also define the limit criteria for the choice of a grid infrastructure suitable for performing the test with the impedance circuit. If the grid infrastructure cannot meet the above requirements, an alternative test circuit utilizing a back-to-back converter is allowed, as shown in Figure 2 and may be added to reduce the grid short-circuit impedance ZGrid. N/APage 12 of 81 Report No.: 6092407.51

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Generally, the X/R value of inductor Z1 and Z2 for the shortcircuit emulator may close to the transmission line impedance values for different countries and regions. It is also appropriate that the inductive impedances Z1 and Z2 should be characterised by an X/R ratio equal to at least 3, in order to reproduce the typical minimum values of X/R found in HV as well as MV power lines. N/A

also appropriate that the inductive impedances Z1 and Z2 should be characterised by an X/R ratio equal to at least 3, in order to reproduce the typical minimum values of X/R found in HV as well as MV power lines. N/A A bypass connection (Switch S 1) of Z1 is usually used to prevent overheating of the impedance Z1 before and after the execution of each test sequence. N/A The voltage drop is created by connecting the impedance Z2 by the switch S2' If the voltage drop is required to be created twice in a short period (for double drop tests), a parallel switch S2' is normally used. The value of Z2/( Z1+ Z2+ZGrid) shall be adjusted to the required voltage magnitudes. For example, when the required voltage magnitude is 50 % of the rated voltage, the value of Z2/ (Z1+Z2+ZGrid) should be about 0.5. N/A The switch S 2 shall be able to accurately control the time between connection and disconnection of Z2 for single phase, two-phase or three-phase tests. If the phase of switch S2 cannot be independently controlled, the serial switch S1 may be used to choose the fault phase. S2 is used to select whether the fault is to earth or not. AII switches may be either mechanical circuit breakers or power electronic devices. N/A The status of switch S 1 and S2 should be set before performing the test The status of switches corresponding to fault types is shown in Table 2. N/A The test report shall specify the values of impedances Z1 and Z2' the related X/R ratio, and a description of the circuit used. In addition, the grid short-circuit power available at the voltage level at which the test is performed shall be documented. N/A The status of switches and fault types are shown in Table 2.

N/A

used. In addition, the grid short-circuit power available at the voltage level at which the test is performed shall be documented. N/A The status of switches and fault types are shown in Table 2.

N/A 4.3.4 Converter based grid simulator PPage 13 of 81 Report No.: 6092407.51

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The test circuit mentioned in 4.3.3 is recommended for simulation of grid faults. However, if the test conditions cannot be met, an alternative test circuit utilizing a back-toback converter is allowed, as shown in Figure 3.

P The test circuit essentially comprises a voltage source with a low internal resistance combined with broadband amplifiers (Iinear or forced switching type) capable of faithfully reproducing three sinusoidal voltages with controlled harmonic content, and adjustable amplitude, fundamental frequency and phase relationship within broad margins. P When the converter is used, it shall meet the following requirements: P a) It shall be capable of independently controlling the three phases in terms of amplitude and phase angle. b) It shall incorporate impedances ZA, ZS and ZC, that can be adjusted in order to reproduce the ohmic and inductive components of short-circuit impedances that are typical of the grid. c) It shall be capable of reproducing the phase voltages and relative phase angles that occur on the LV side of transformers in the event of each of the various fault types. (See Annex A for the vector representations for each fault). P If the programmable voltage source is a bi-directional, controlled capable of replicating the influence of shortcircuit impedances ZA, ZB, ZC may be omitted. P 5 Test P 5.1 Test protocol P The LVRT test protocol is designed to verify that the EUT

controlled capable of replicating the influence of shortcircuit impedances ZA, ZB, ZC may be omitted. P 5 Test P 5.1 Test protocol P The LVRT test protocol is designed to verify that the EUT responds appropriately to voltage drops (due to grid faults). During the test, the EUT shall demonstrate that it can: • Appropriately detect the simulated fault. • Ride through the event and continue operation as specified in the applicable curves. • Not suffer any damage from the event. PPage 14 of 81 Report No.: 6092407.51

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TRF No. IEC TS 62910_V2.0

The response to the voltage drop specified operating period with two output power ranges a) between 0.1 Pn and 0.3 Pn; b) above 0.9 Pn; and with two fault conditions : c) three-phase drop; d) two-phase drop or single-phase drop. The tests should be carried out at least twice at each test point listed in Table 3.

a. Double drop test may be required in some countries or regions. For devices under test not being required for double drop test, above testing points can be omitted.

b. Drop depth is the residual voltage during the LVRT testing period which can be decided according 10 the requirement specified by different countries or regions (See Clause B.2 for drop depth ratio calculation.)

c. Drop phase can be decided according 10 the requirement specified by different countries or regions; the value of two-phase voltage should be line voltage.

d. The test should be carried out under specified K-factor provided by local manufacture

P 5.2 Test curve PPage 15 of 81 Report No.: 6092407.51

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d. The test should be carried out under specified K-factor provided by local manufacture

P 5.2 Test curve PPage 15 of 81 Report No.: 6092407.51

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TRF No. IEC TS 62910_V2.0

The LVRT response characteristic shall meet the requirements of the LVRT curve specified by different countries and regions as needed. An example LVRT curve is shown in Figure 4.

P The example curve shows that the EUT should keep operating during operating conditions indicated in the area above the LVRT curve. Specifically, the EUT should keep operating for (t1 – t0) seconds without disconnecting from the grid when the interconnection voltage drops to 0 % of rated voltage; for (t2 – t0) seconds when the voltage drops to 30 % of rated voltage; and for (t3 – t0) seconds when the voltage drops to 70 % of rated voltage. The EUT should disconnect from the grid during operating conditions indicated within the shaded areas. P The example shows two types of points on the LVRT curve: the lowest point and the inflection point. Tests shall be carried out at both types of points. P 5.3 Test procedure P 5.3.1 Pre-test P Prior to the fault simulation tests. the EUT should run in normal operating mode. The selected LVRT curve should be used to identify voltage drop points. including the lowest point and the inflection point. as well as other random points in the curve. Selection of the drop time should follow the requirement of the applicable country or region. P 5.3.2 No-Ioad test P Prior to the load test, adjust the fault emulator to simulate symmetrical and asymmetrical voltage drops without EUT connection. and validate that the measured results are as intended.

follow the requirement of the applicable country or region. P 5.3.2 No-Ioad test P Prior to the load test, adjust the fault emulator to simulate symmetrical and asymmetrical voltage drops without EUT connection. and validate that the measured results are as intended. This step ensures that the amplitude of voltage and drop duration can match the requirements in Figure 5. P 5.3.3 Tolerance P The tolerances for drop depth and duration during the noIoad test shall reference the requirement of Figure 6 in IEC 61400-21 :2008, and not exceed the values shown in Figure 5 PPage 16 of 81 Report No.: 6092407.51

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TRF No. IEC TS 62910_V2.0

The tolerance for voltage magnitude is ±5% of rated voltage for the period before and during the voltage drop. The tolerance for voltage magnitude is ±10 % of rated voltage during the period after voltage is recovered. The tolerances shall be measured between 0 and +5 % of rated voltage for the lowest point and the inflection point under no-Ioad conditions. P The duration of each voltage drop is determined according to the requirements of the applicable LVRT curve. The tolerance range for both drop duration and rise time prefers 40ms.

P 5.3.4 Load test P Tests under load shall be carried out after the no-Ioad test results successfully meet the performance requirements. The parameters of the grid fault simulator should be consistent with the no-Ioad test. P With the EUT connected to the grid fault simulator device and the PV simulator (or PV array), the output power should be set to (0.1-0.3) Pn and above 0.9Pn separately. Additional load tests at other power levels should be performed as determined by the specific regional requirements. P

and the PV simulator (or PV array), the output power should be set to (0.1-0.3) Pn and above 0.9Pn separately. Additional load tests at other power levels should be performed as determined by the specific regional requirements. P During the LVRT test, MP1, MP2, and MP3 (shown in Figure 1) shall be selected as the test points for measuring and recording the values of voltage and current. P The waveform and data of the measured voltage and current at the measuring points shall be recorded by the data acquisition device from time A prior to the voltage drop to time B after the subsequent voltage rise. For "A" and "B", specific data should be determined by different countries or regions. P 6 Assessment criteria PPage 17 of 81 Report No.: 6092407.51

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TRF No. IEC TS 62910_V2.0

The various assessment criteria is determined by the requirements of the different countries or regions. The characteristics and performance criteria for utilization are shown in Annex B, and can be referenced by a local user. PPage 18 of 81 Report No.: 6092407.51

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TRF No. IEC TS 62910_V2.0

Annex A Circuit faults and voltage drops (informative) P A.1 Fault types P The grid faults of high voltage power transmission line are commonly divided into four different types: single-phase grounded fault, two-phase short circuit fault, two-phase grounded fault, and three-phase short circuit fault. The most common one is the single-phase grounded fault, which accounting for over 90 % of the total number of the faults. P Considering the different fault phases, the short circuit paths for all types of fault are shown in Table A.1.

three-phase short circuit fault. The most common one is the single-phase grounded fault, which accounting for over 90 % of the total number of the faults. P Considering the different fault phases, the short circuit paths for all types of fault are shown in Table A.1.

PPage 19 of 81 Report No.: 6092407.51

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P A.2 Voltage drops P A .2.1 General P When a fault occurs, the voltage amplitude in the faulted phase should be decreased. When a fault occurs between two phases, the phase angle should be changed on inverter output side. Due to the different types of linetransformer connections, the magnitude and phase of inverter AC voltage will vary. Figure A.1 shows the circuit topology under the fault condition. As indicated in Table A.1, the value of fault phase voltage at the fault point is zero. (If the grid fault type is two-phase short circuit fault without ground, the line voltage between two fault phases should be zero.) Because PCC is the common connection point of the infinite grid, Zi between the fault point and PCC could be treated as infinite. The voltage drop amplitude and phase deviation in PV inverter AC side have been determined by the value of Zp and type of transformer. PPage 20 of 81 Report No.: 6092407.51

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TRF No. IEC TS 62910_V2.0

The transformer "T" represents the voltage and phase transformation being equivalent to all the transformers between the fault point and the PV inverter, because one or more transformers are connected. The equivalent transformer "T" has only two types -Y/Y or Y/Δ. In order to

The transformer "T" represents the voltage and phase transformation being equivalent to all the transformers between the fault point and the PV inverter, because one or more transformers are connected. The equivalent transformer "T" has only two types -Y/Y or Y/Δ. In order to simplify the analysis, the transformer windings could be considered as one of two types, Yn/Yn12 and Δ/Yn11, with a ratio of 1. P A.2.2 Three-phase short-circuit fault P Figure A.2 illustrates the change in inverter AC voltage magnitude and phase when a three